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Welcome to the SRX Beamline Wiki!
The Sub-micron Resolution X-ray spectroscopy (SRX) beamline at NSLS-II supports a wide variety of scientific use-cases, ranging from materials and energy sciences to Earth and environmental sciences. The SRX beamline provides a sub-500 nm focused X-ray beam for high-resolution X-ray fluorescence (XRF) elemental mapping and X-ray absorption near-edge structure (XANES) spectroscopy. The sample is mounted in air - which helps provide a flexible sample environment for a wide variety of sample mounts and in situ and operando experiments.
Additional information about the SRX beamline is maintained on our Read the Docs page.
| General User Techniques | X-ray Fluorescence Imaging
XANES Spectroscopy |
| Scientific Disciplines | Energy Science
Material Science Biology Earth and Environmental Science |
| X-ray Source | 21 mm period in-vacuum undulator (IVU-21) |
| Energy Range | 4.5 - 20 keV |
| Monochromator Crystals | Si 111 |
| X-ray Flux | 1013 ph/s |
| Sample Focusing Optics | Fixed-curvature KB mirrors |
| Focused Resolution at Sample | 200-500 nm |
| Primary Detector | Hitachi Vortex ME7 Silicon Drift Detector |
| Sample Environment | Sample installed using Newport BK-1A kinematic mount
Sample is measured in air Designed imaging range < 100x100 μm2 |
| Data Acquisition | Data collected using Bluesky |
| Data Analysis | XRF maps analyzed using PyXRF
XANES spectra analyzed using Demeter-Athena |